This course aims to provide an introduction to the underlying theory essential to understanding the techniques of advanced materials characterisation, complemented by demonstrations of the techniques and practical analysis of samples. Successful students should ultimately be able, in their future careers, to know how to answer the question: “what is this?”, and to use that answer to contribute to answering the next question: “why is it doing what it is doing?” This course is not suitable for off-campus enrolments.
Course Outline
IntroductionWhy characterise materials? Overview of techniques. Surfaces and bulk materials.
Microscopy and Microanalysis IScanning Electron Microscopy (SEM), and Energy & Wavelength Dispersive Spectroscopy (EDS/WDS), Environmental SEM (ESEM), Electron Back Scatter Diffraction (EBSD), Focused Ion Beam (FIB).
Surface analysis and spectroscopyIntroduction to surfaces, spectroscopy techniques for materials characterisation.
NanoindentationHistory, analysis models, tip shape, material and design, SPM imaging, peripheral techniques.
Microscopy and Microanalysis IITransmission Electron Microscopy (TEM), TEM sample preparation, selected area electron diffraction (SAED), Kikuchi lines, bright field (BF) and dark field (DF) TEM images, High-resolution TEM (HRTEM), scanning-TEM (STEM), electron energy-loss spectroscopy (EELS) and Energy-filtered TEM (EFTEM).
Atomic Force MicroscopyAtomic Force Microscopy (AFM), History, analysis modes, tip shape, peripheral techniques.